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Aehr Test Systems Schwankungsanfälligkeit

Was ist das Schwankungsanfälligkeit von Aehr Test Systems?

Schwankungsanfälligkeit von Aehr Test Systems ist 8.76%

Was ist die Definition von Schwankungsanfälligkeit?

Die Schwankungsanfälligkeit oder Prozent des durchschnittlichen wahren Bereichs (ATRP 14) ist die ATR, ausgedrückt als Prozentsatz des Schlusskurses.

Average true range percent (ATRP) measures volatility on a relative level. This is opposed to the ATR, which measures volatility on an absolute level. ATRP allows securities to be compared whereas ATR does not. That means lower-priced stocks won't necessarily have lower ATR values than higher-priced stocks.

The period used in the calculation is 14 days and the normalized indicator oscillates between 0 and 100 percent of recent price variation. Importantly, the indicator doesn't predict the direction of price but it describes the current volatility. The volatility is comparable across all securities and all markets.

Volatility expresses the degree of price movement. The use of ATRP as volatility compared to ATR is preferred in cases when different securities or different time periods are compared. Examples are stock screening, filtering strategies, and studying seasonality and volatility patterns over long periods of time and different markets

Schwankungsanfälligkeit von Unternehmen in Technology Sektor auf NASDAQ im Vergleich zu Aehr Test Systems

Was macht Aehr Test Systems?

headquartered in fremont, california, aehr test systems is a worldwide supplier of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. aehr test has developed and introduced several innovative products, including the abts, foxtm and max systems and the diepak® carrier. the abts system is aehr test’s newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices. the fox system is a full wafer contact test and burn-in system. the max system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. the diepak carrier is a reusable, temporary package that enables ic manufacturers to perform cost-effective final test and burn-in of bare die.

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